Methodology
How the Geyser Patent Attorney Directory builds the largest patent practitioner expertise database and computes PatentFit Scores from public USPTO data.
Data Sources
Every data point is derived from public USPTO records. No self-reported profiles, paid listings, or data that cannot be independently verified.
- USPTO Patent Center- Patent filings, prosecution history, grant records
- USPTO OED Practitioner Search- Registration verification and status
- CPC Classification- Technology codes assigned by USPTO examiners
Cross-Reference Methodology
We cross-reference every registered patent practitioner with the specific patents they have filed, then aggregate by CPC classification. This produces a quantitative specialization profile: what technologies each practitioner has actually patented, verified against government records.
PatentFit Score Calculation
PatentFit is a composite score (0-100) measuring how well a practitioner's actual filing record aligns with a specific technology area.
| Component | Weight | Measures |
|---|---|---|
| Specialization Depth | 35% | Number of patents filed in the specific CPC sub-class |
| Allowance Rate | 25% | Grant rate for applications in this technology area |
| Filing Recency | 20% | How recently the practitioner has filed in this area |
| Experience | 20% | Years of practice in this technology area |
Score Tiers
Limitations
PatentFit measures filing history, not legal outcome quality. It does not capture client satisfaction, fee structures, or litigation experience. We encourage inventors to use PatentFit as one input alongside direct consultation.